Multi-pass Lot Scheduling Algorithm for Maximizing Throughput at Semiconductor Final Test Facilities
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Procedia Manufacturing
سال: 2017
ISSN: 2351-9789
DOI: 10.1016/j.promfg.2017.07.350